Simulation of Dislocation Accumulation in Impurity Doped-ULSI Cells and Electric Characteristic Evaluations. - Michihiro Sato; Yosuke Takahashi (Int. J. Autom. Technol., 2016)

Integrating CAD, TRIZ, and Customer Needs. - A. M. M. Sharif Ullah; Michihiro Sato; Michiko Watanabe; Md. Mamunur Rashid (Int. J. Autom. Technol., 2016)