Ground Bounce Considerations in DC Parametric Test Generation Using Boundary Scan. - Amitava Majumdar 002; Michio Komoda; Tim Ayres (VTS, 1998)

A Time-Slicing Ring Oscillator for Capturing Instantaneous Delay Degradation and Power Supply Voltage Drop. - Takashi Sato 001; Yu Matsumoto; Koji Hirakimoto; Michio Komoda; Junichi Mano (CICC, 2006)

Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. - Kan Takeuchi; Atsushi Yoshikawa 003; Michio Komoda; Ken Kotani; Hiroaki Matsushita; Yusaku Katsuki; YuyoYamamoto; Takao Sato (IEEE Trans. Very Large Scale Integr. Syst., 2008)

A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule. - Masanori Kurimoto; Jun Matsushima; Shigeki Ohbayashi; Yoshiaki Fukui; Michio Komoda; Nobuhiro Tsuda (ACM Trans. Design Autom. Electr. Syst., 2012)