Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations. - Michitarou Yabuuchi; Kazutoshi Kobayashi (FPT, 2010)

NBTI-Induced Delay Degradation Analysis of FPGA Routing Structures. - Michitarou Yabuuchi; Kazutoshi Kobayashi (IPSJ Trans. Syst. LSI Des. Methodol., 2012)

Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs. - Michitarou Yabuuchi; Ryo Kishida; Kazutoshi Kobayashi (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2014)

Size Optimization Technique for Logic Circuits that Considers BTI and Process Variations. - Michitarou Yabuuchi; Kazutoshi Kobayashi (IPSJ Trans. Syst. LSI Des. Methodol., 2016)

Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS. - Takuya Komawaki; Michitarou Yabuuchi; Ryo Kishida; Jun Furuta; Takashi Matsumoto; Kazutoshi Kobayashi (ICICDT, 2017)

Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model. - Takuya Komawaki; Michitarou Yabuuchi; Ryo Kishida; Jun Furuta; Takashi Matsumoto; Kazutoshi Kobayashi (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2017)

Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators. - Kazutoshi Kobayashi; Tomoharu Kishita; Hiroki Nakano; Jun Furuta; Mitsuhiko Igarashi; Shigetaka Kumashiro; Michitarou Yabuuchi; Hironori Sakamoto (IRPS, 2023)