Characterisation of the Al2O3 films deposited by ultrasonic spray pyrolysis and atomic layer deposition methods for passivation of 4H-SiC devices. - Maciej Wolborski; Mietek Bakowski; Armando Ortiz; Viljami Pore; Adolf Schöner; Mikko Ritala; Markku Leskelä; Anders Hallén (Microelectron. Reliab., 2006)

Short-Circuit Protection Circuits for Silicon-Carbide Power Transistors. - Diane-Perle Sadik; Juan Colmenares; Georg Tolstoy; Dimosthenis Peftitsis; Mietek Bakowski; Jacek Rabkowski; Hans-Peter Nee (IEEE Trans. Ind. Electron., 2016)

Comparison of Thermal Stress During Short-Circuit in Different Types of 1.2-kV SiC Transistors Based on Experiments and Simulations. - Diane-Perle Sadik; Juan Colmenares; Jang-Kwon Lim; Mietek Bakowski; Hans-Peter Nee (IEEE Trans. Ind. Electron., 2021)

On the Design of Junction Termination for 4H-SiC High-Voltage Devices. - Zimo Yuan; Anders Hallén; Mietek Bakowski (IEEE Access, 2025)