Finite aperture time effects in sampling circuit. - Miho Arai; Isao Shimizu; Haruo Kobayashi 001; Keita Kurihara; Shu Sasaki; Shohei Shibuya; Kiichi Niitsu; Kazuyoshi Kubo (ASICON, 2015)

Fundamental design tradeoff and performance limitation of electronic circuits based on uncertainty relationships. - Haruo Kobayashi 001; Isao Shimizu; Nobukazu Tsukiji; Miho Arai; Kazuyoshi Kubo; Hitoshi Aoki (ASICON, 2017)