IC Immunity Modeling Process Validation Using On-Chip Measurements. - Sonia Ben Dhia; Alexandre Boyer; Bertrand Vrignon; Mikaël Deobarro (J. Electron. Test., 2012)

On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. - Sonia Bendhia; Alexandre Boyer; Bertrand Vrignon; Mikaël Deobarro; Thanh Vinh Dinh (IEEE Trans. Instrum. Meas., 2012)