Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. - Jonathan T.-Y. Chang; Chao-Wen Tseng; Chien-Mo James Li; Mike Purtell; Edward J. McCluskey (ITC, 1998)

Experimental Results for IDDQ and VLV Testing. - Jonathan T.-Y. Chang; Chao-Wen Tseng; Yi-Chin Chu; Sanjay Wattal; Mike Purtell; Edward J. McCluskey (VTS, 1998)

Testing for resistive opens and stuck opens. - Chao-Wen Tseng; Chien-Mo James Li; Mike Purtell; Edward J. McCluskey (ITC, 2001)