Test challenges for deep sub-micron technologies. - Kwang-Ting Cheng; Sujit Dey; Mike Rodgers; Kaushik Roy 001 (DAC, 2000)

Test of Future System-on-Chips. - Yervant Zorian; Sujit Dey; Mike Rodgers (ICCAD, 2000)

Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. - Mike Rodgers (ITC, 2000)

March Tests for Realistic Faults in Two-Port Memories. - Said Hamdioui; Ad J. van de Goor; Mike Rodgers; David Eastwick (MTDT, 2000)

Detecting Unique Faults in Multi-port SRAMs. - Said Hamdioui; Ad J. van de Goor; David Eastwick; Mike Rodgers (Asian Test Symposium, 2001)

Realistic Fault Models and Test Procedures for Multi-Port SRAMs. - Said Hamdioui; Ad J. van de Goor; David Eastwick; Mike Rodgers (MTDT, 2001)

ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing. - Mike Rodgers (VTS, 2001)

March SS: A Test for All Static Simple RAM Faults. - Said Hamdioui; Ad J. van de Goor; Mike Rodgers (MTDT, 2002)

Debating the Future of Burn-In. - Edward J. McCluskey; Subhasish Mitra; Bob Madge; Peter C. Maxwell; Phil Nigh; Mike Rodgers (VTS, 2002)

2001 Technology Roadmap for Semiconductors. - Alan Allan; Don Edenfeld; William H. Joyner Jr.; Andrew B. Kahng; Mike Rodgers; Yervant Zorian (Computer, 2002)

March SL: A Test For All Static Linked Memory Faults. - Said Hamdioui; Zaid Al-Ars; Ad J. van de Goor; Mike Rodgers (Asian Test Symposium, 2003)

Detecting Intra-Word Faults in Word-Oriented Memories. - Said Hamdioui; Ad J. van de Goor; Mike Rodgers (VTS, 2003)

Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. - Said Hamdioui; Zaid Al-Ars; Ad J. van de Goor; Mike Rodgers (J. Electron. Test., 2003)

2003 Technology Roadmap for Semiconductors. - Don Edenfeld; Andrew B. Kahng; Mike Rodgers; Yervant Zorian (Computer, 2004)

Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. - Said Hamdioui; Zaid Al-Ars; Ad J. van de Goor; Mike Rodgers (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Session Abstract. - Ajay Khoche; Mike Rodgers; Pete O'Neil (VTS, 2006)