Reliability Beyond GHz. - Pete O'Neill; Ron Richmond; Mike Tripp; Barbara Vasquez; Art Wager; Zeev Weinberg (VTS, 2001)

Realizing the Benefits of Structural Test for Intel Microprocessors. - Mike Mayberry; John Johnson; Navid Shahriari; Mike Tripp (ITC, 2002)

On-Die DFT Based Solutions are Sufficient for Testing Multi-GHz Interfaces in Manufacturing (and Are Also Key to Enabling Lower Cost ATE Platforms). - Mike Tripp (ITC, 2002)

Elimination of Traditional Functional Testing of Interface Timings at Intel. - Mike Tripp; T. M. Mak; Anne Meixner (ITC, 2003)

Design considerations and DFT to enable testing of digital interfaces. - Mike Tripp; T. M. Mak; Anne Meixner (CICC, 2004)

ITC 2004 Panel: Cost of Test - Taking Control. - Mike Tripp (ITC, 2004)

Testing Gbps Interfaces without a Gigahertz Tester. - T. M. Mak; Mike Tripp; Anne Meixner (IEEE Des. Test Comput., 2004)

Drive only at speed functional testing; one of the techniques Intel is using to control test costs. - Mike Tripp; Silvio Picano; Baruch Schnarch (ITC, 2005)

The Challenges of Nanotechnology and Gigacomplexity. - Gadi Singer; Rajesh Galivanche; Srinivas Patil; Mike Tripp (IEEE Des. Test Comput., 2009)