Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers. - Yingquan Zhou; Mike W. T. Wong; Yinghua Min (FTCS, 1995)

Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation. - Tao Wei; Mike W. T. Wong; Yim-Shu Lee (Asian Test Symposium, 1996)

Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis. - Yingquan Zhou; Mike W. T. Wong; Yinghua Min (J. Electron. Test., 1996)

Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits. - Joseph C. W. Pang; Mike W. T. Wong; Yim-Shu Lee (Asian Test Symposium, 1997)

DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity. - Mike W. T. Wong; Matthew Worsman (Asian Test Symposium, 1998)

Nonlinear circuit fault diagnosis with large change sensitivity. - Matthew Worsman; Mike W. T. Wong (ICECS, 1998)

On concurrent multiple error diagnosability in linear analog circuits using continuous checksum. - Yingquan Zhou; Mike W. T. Wong; Yinghua Min (Int. J. Circuit Theory Appl., 1998)

New built-in self-test technique based on addition/subtraction of selected node voltages. - K. Y. Ko; Mike W. T. Wong (Asian Test Symposium, 2000)

Analog circuit equivalent faults in the D.C. domain. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (Asian Test Symposium, 2000)

A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (ISQED, 2000)

Non‐linear analog circuit fault diagnosis with large change sensitivity. - Matthew Worsman; Mike W. T. Wong (Int. J. Circuit Theory Appl., 2000)

On the issues of oscillation test methodology. - Mike Wai-Tak Wong (IEEE Trans. Instrum. Meas., 2000)

The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (ETW, 2001)

Testing System-On-Chip by Summations of Cores? Test Output Voltages. - K. Y. Ko; Mike W. T. Wong; Yim-Shu Lee (Asian Test Symposium, 2002)

Analog and Mixed-Signal IP Cores Testing. - Mike W. T. Wong; K. Y. Ko; Yim-Shu Lee (DELTA, 2002)

Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis. - Matthew Worsman; Mike W. T. Wong; Yim-Shu Lee (DELTA, 2002)

Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis. - Mike W. T. Wong (Asian Test Symposium, 2003)

Design and Implementation of Self-Testable Full Range Window Comparator. - Mike W. T. Wong; Yubin Zhang (Asian Test Symposium, 2004)