Threshold energies in the light emission characteristics of silicon MOS tunnel diodes. - N. Asli; M. I. Vexler; A. F. Shulekin; P. Douglas Yoder; I. V. Grekhov; Peter Seegebrecht (Microelectron. Reliab., 2001)

Soft breakdown of MOS tunnel diodes with a spatially non-uniform oxide thickness. - R. Khlil; A. El Hdiy; A. F. Shulekin; S. E. Tyaginov; M. I. Vexler (Microelectron. Reliab., 2004)

Tunnel charge transport within silicon in reversely-biased MOS tunnel structures. - M. I. Vexler; A. El Hdiy; D. Grgec; S. E. Tyaginov; R. Khlil; Bernd Meinerzhagen; A. F. Shulekin; I. V. Grekhov (Microelectron. J., 2006)

The post-damage behavior of a MOS tunnel emitter transistor. - S. E. Tyaginov; M. I. Vexler; A. F. Shulekin; I. V. Grekhov (Microelectron. Reliab., 2006)

Application of an MOS tunnel transistor for measurements of the tunneling parameters and of the parameters of electron energy relaxation in silicon. - I. V. Grekhov; G. G. Kareva; S. E. Tyaginov; M. I. Vexler (Microelectron. Reliab., 2007)

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs. - Prateek Sharma; Stanislav Tyaginov; Stewart E. Rauch; Jacopo Franco; Ben Kaczer; Alexander Makarov; Mikhail I. Vexler; Tibor Grasser (ESSDERC, 2016)

Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics. - Yury Yu. Illarionov; Alexander G. Banshchikov; Theresia Knobloch; Dmitry K. Polyushkin; Stefan Wachter; V. V. Fedorov; S. M. Suturin; M. Stöger-Pollach; Thomas Mueller; M. I. Vexler; Nikolai S. Sokolov; Tibor Grasser (DRC, 2020)

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors. - Stanislav Tyaginov; Aryan Afzalian; Alexander Makarov; Alexander Grill; Michiel Vandemaele; Maksim Cherenev; Mikhail I. Vexler; Geert Hellings; Ben Kaczer (IRPS, 2022)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. - Stanislav Tyaginov; Alexander Makarov; Al-Moatasem Bellah El-Sayed; Adrian Vaisman Chasin; Erik Bury; Markus Jech; Michiel Vandemaele; Alexander Grill; An De Keersgieter; Mikhail I. Vexler; Geert Eneman; Ben Kaczer (IRPS, 2022)