Effects of Organizational Changes on Product Metrics and Defects. - Seiji Sato; Hironori Washizaki; Yoshiaki Fukazawa; Sakae Inoue; Hiroyuki Ono; Yoshiiku Hanai; Mikihiko Yamamoto (APSEC (1), 2013)

How Does Defect Removal Activity of Developer Vary with Development Experience? - Reou Ando; Seiji Sato; Chihiro Uchida; Hironori Washizaki; Yoshiaki Fukazawa; Sakae Inoue; Hiroyuki Ono; Yoshiiku Hanai; Masanobu Kanazawa; Kazutaka Sone; Katsushi Namba; Mikihiko Yamamoto (SEKE, 2015)