Reduced Peripheral Leakage Current in Pin Photodetectors of Ge on n+-Si by P+ Implantation to Compensate Surface Holes. - Koji Abe; Mikiya Kuzutani; Satoki Furuya; Jose A. Piedra-Lorenzana; Takeshi Hizawa; Yasuhiko Ishikawa (IEICE Trans. Electron., 2024)