Hardware Reduction and Statistical Verification of Cryptographic Standard Cell Resistant to SCA. - Milena Stanojlovic Mirkovic; Miljana Milic; Dejan Mirkovic; Vanco B. Litovski (J. Circuits Syst. Comput., 2020)

A Defects Classification Algorithm for the Hybrid OBT-IDDQ Fault Diagnosis Technique in Analog CMOS Integrated Circuits. - Dejan Mirkovic; Milena Stanojlovic Mirkovic; Miljana Milic; Vladimir Petrovic (J. Circuits Syst. Comput., 2024)