A Novel Method for Determining the R-Card Sheet Impedance Using the Transmission Coefficient Measured in Free-Space or Waveguide Systems. - Milo W. Hyde; Michael J. Havrilla; Paul E. Crittenden (IEEE Trans. Instrum. Meas., 2009)

Material Classification of an Unknown Object Using Turbulence-Degraded Polarimetric Imagery. - Milo W. Hyde; Stephen C. Cain; Jason D. Schmidt; Michael J. Havrilla (IEEE Trans. Geosci. Remote. Sens., 2011)

Broadband Characterization of Materials Using a Dual-Ridged Waveguide. - Milo W. Hyde; Michael J. Havrilla; Andrew E. Bogle; Nathan J. Lehman (IEEE Trans. Instrum. Meas., 2013)

High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture. - Andrew E. Bogle; Milo W. Hyde; Michael J. Havrilla; Jeffrey S. Sovern (IEEE Trans. Instrum. Meas., 2017)

Nondestructive Electromagnetic Characterization of Uniaxial Sheet Media Using a Two-Flanged Rectangular Waveguide Probe. - Neil Rogers; Michael J. Havrilla; Milo W. Hyde; Alexander Knisely (IEEE Trans. Instrum. Meas., 2020)