A Compact One-Transistor-Multiple-RRAM Characterization Platform. - Max Uhlmann; Milosz Krysik; Jianan Wen; Max Frohberg; Andrea Baroni; Keerthi Dorai Swamy Reddy; Eduardo Pérez; Philip Ostrovskyy; Krzysztof Piotrowski; Corrado Carta; Christian Wenger; Gerhard Kahmen (IEEE Trans. Circuits Syst. I Regul. Pap., 2025)