Move-to-Data: A new Continual Learning approach with Deep CNNs, Application for image-class recognition. - Miltiadis Poursanidis; Jenny Benois-Pineau; Akka Zemmari; Boris Mansencal; Aymar de Rugy (CoRR, 2020)

Capturing and incorporating expert knowledge into machine learning models for quality prediction in manufacturing. - Patrick Link; Miltiadis Poursanidis; Jochen Schmid; Rebekka Zache; Martin von Kurnatowski; Uwe Teicher; Steffen Ihlenfeldt (J. Intell. Manuf., 2022)