Digital built-in self-test of CMOS analog iterative decoders. - Mimi Yiu; Chris Winstead; Vincent C. Gaudet; Christian Schlegel (ISCAS (3), 2005)

Design for Testability of CMOS Analog Sum-Product Error-Control Decoders. - Mimi Yiu; Chris Winstead; Vincent C. Gaudet; Christian Schlegel (IEEE Trans. Circuits Syst. II Express Briefs, 2007)