A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. - Kaustubh Joshi 003; Yung-Huei Lee; Yu-Cheng Yao; Shu-Wen Chang; Siao-Syong Bian; P. J. Liao; Jiaw-Ren Shih; Min-Jan Chen (IRPS, 2019)