Wafer Map Pattern Analytics Driven By Natural Language Queries. - Yueling Jenny Zeng; Min Jian Yang; Li-C. Wang (ITC-Asia, 2022)

Language Driven Analytics for Failure Pattern Feedforward and Feedback. - Min Jian Yang; Yueling Zeng; Li-C. Wang (ITC, 2022)

IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat. - Matthew Dupree; Min Jian Yang; Yueling Jenny Zeng; Li-C. Wang (ITC, 2023)

WM-Graph: Graph-Based Approach for Wafermap Analytics. - Min Jian Yang; Yueling Jenny Zeng; Li-C. Wang (ITC, 2024)