Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. - Sang Min Kim; Min-Ju Ahn; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2016)

Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. - Jong Hoon Lee; Seul Ki Yu; Jae Won Kim; Min-Ju Ahn; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2016)