Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. - Kihoon Nam; Chanyang Park; Hyeok Yun; Jun-Sik Yoon; Hyundong Jang; Kyeongrae Cho; Min Sang Park; Hyun-Chul Choi; Rock-Hyun Baek (IEEE Access, 2023)

Modeling of 3D NAND Characteristics for Cross-Temperature by Using Graph Neural Network and Its Application. - Kyeongrae Cho; Jeong-Sik Lee; Chanyang Park; Hyeok Yun; Hyundong Jang; Seungjoon Eom; Min Sang Park; Hyun-Chul Choi; Rock-Hyun Baek (Adv. Intell. Syst., 2023)