A Multi-Modal AI Inspection System for Laser Labels. - Min Sik Byun; Malcolm Yoke Hean Low; David Weidong Lin 001 (TENCON, 2024)

Mitigating Algorithmic Bias in Multiclass CNN Classifications Using Causal Modeling. - Min Sik Byun; Wendy Wan Yee Hui; Wai Kwong Lau (CoRR, 2025)