Accurate Prediction and Reliable Parameter Optimization of Neural Network for Semiconductor Process Monitoring and Technology Development. - Hyeok Yun; Chang-Hyeon An; Hyundong Jang; Kyeongrae Cho; Jeong-Sik Lee; Seungjoon Eom; Choong-Ki Kim; Min-Soo Yoo; Hyun-Chul Choi; Rock-Hyun Baek (Adv. Intell. Syst., 2023)

Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring. - Hyeok Yun; Hyundong Jang; Seunghwan Lee; Junjong Lee; Kyeongrae Cho; Seungjoon Eom; Soomin Kim; Choong-Ki Kim; Hong-Chul Byun; Seongjoo Han; Min-Soo Yoo; Rock-Hyun Baek (Adv. Intell. Syst., 2024)

Capacitive Synaptor with Gate Surrounding Semiconductor Pillar Structure and Overturned Charge Injection for Compute-in-Memory. - Choong-Ki Kim; James Read; Minji Shon; Tae-Hyeon Kim; Myung-Su Kim; Ji-Man Yu; Min-Soo Yoo; Yang-Kyu Choi; Shimeng Yu (Adv. Intell. Syst., 2025)