Reliable High-Quality Metal-Embedded h-BN Contacts to p-type WSe2. - Younghun Jung; Min Sup Choi; Abhinandan Borah; Ankur Nipane; Won Jong Yoo; James Hanel; James T. Teherani (DRC, 2018)

Atomic Layer Etching (ALE) of WSe2 Yielding High Mobility p-FETs. - Ankur Nipane; Punnu Jose Sebastian; Younghun Jung; Min Sup Choi; Abhinandan Borah; Won Jong Yoo; James C. Hone; James T. Teherani (DRC, 2019)

Multi-Domain Data Integration for Plasma Diagnostics in Semiconductor Manufacturing Using Tri-CycleGAN. - Minji Kang; Sung Kyu Jang; Jihun Kim; Seongho Kim; Changmin Kim; Hyo-Chang Lee; Wooseok Kang; Min Sup Choi; Hyeongkeun Kim; Hyeong-U. Kim (J. Sens. Actuator Networks, 2024)

In-situ and Non-contact Etch Depth Prediction in Plasma Etching via Machine Learning (ANN & BNN) and Digital Image Colorimetry. - Minji Kang; Seongho Kim; Eunseo Go; Donghyeon Paek; Geon Lim; Muyoung Kim; Soyeun Kim; Sung Kyu Jang; Min Sup Choi; Woo Seok Kang; Jaehyun Kim; Jaekwang Kim; et al. (CoRR, 2025)