Fault Simulation for VHDL Based Test Bench and BIST Evaluation. - Hamed Farshbaf; Mina Zolfy; Shahrzad Mirkhani; Zainalabedin Navabi (Asian Test Symposium, 2001)

Adaptation of an event-driven simulation environment to sequentially propagated concurrent fault simulation. - Mina Zolfy; Shahrzad Mirkhani; Zainalabedin Navabi (DATE, 2001)