An AOI system development for inspecting defects on 6 surfaces of chips. - Ming-Fu Chen; Chih-Wen Chen; Chih-Yen Chen; Chi-Hung Hwang; Liang-Yin Hwang (I2MTC, 2016)

Experimental and numerical investigations for deposited nanosilver tracks on polyimide films. - Chia-Yen Chan; Ming-Fu Chen; Kuan-Cheng Shih (I2MTC, 2018)

Design and validation of aberration-free plenoptic imaging system for industrial inspection. - Chih-Hao Lin; Po-Ming Lin; Chih-Wen Chen; Ming-Fu Chen (IST, 2022)

Development of a wide-field-of-view microscope objective system with high resolution and long working distance. - Wei-Jei Peng; Chih-Wen Chen; Yi-Hao Lin; Ming-Fu Chen (IST, 2022)