Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. - Kuo-Liang Cheng; Ming-Fu Tsai; Cheng-Wen Wu (VTS, 2001)

Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories. - Kuo-Liang Cheng; Ming-Fu Tsai; Cheng-Wen Wu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults. - Hong-Chou Kao; Ming-Fu Tsai; Shi-Yu Huang; Cheng-Wen Wu; Wen-Feng Chang; Shyue-Kung Lu (J. Inf. Sci. Eng., 2003)

A comprehensive comparative analysis of FinFET and Trigate device, SRAM and logic circuits. - Chia-Hao Pao; Ming-Long Fan; Ming-Fu Tsai; Yin-Nien Chen; Vita Pi-Ho Hu; Pin Su; Ching-Te Chuang (APCCAS, 2012)

Variation tolerant CLSAs for nanoscale Bulk-CMOS and FinFET SRAM. - Ming-Fu Tsai; Jen-Huan Tsai; Ming-Long Fan; Pin Su; Ching-Te Chuang (APCCAS, 2012)

A comparative analysis of tunneling FET circuit switching characteristics and SRAM stability and performance. - Yin-Nien Chen; Ming-Long Fan; Vita Pi-Ho Hu; Ming-Fu Tsai; Chia-Hao Pao; Pin Su; Ching-Te Chuang (ESSDERC, 2012)

Impacts of random telegraph noise on the analog properties of FinFET and trigate devices and Widlar current source. - Chia-Hao Pao; Ming-Long Fan; Ming-Fu Tsai; Yin-Nien Chen; Vita Pi-Ho Hu; Pin Su; Ching-Te Chuang (ICICDT, 2012)