Modified LC-tank ESD protection design for 60-GHz RF applications. - Chun-Yu Lin 001; Li-Wei Chu; Shiang-Yu Tsai; Ming-Dou Ker; Tse-Hua Lu; Tsun-Lai Hsu; Ping-Fang Hung; Ming-Hsiang Song; Jeng-Chou Tseng; Tzu-Heng Chang; Ming-Hsien Tsai 002 (ECCTD, 2011)

Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology. - Li-Wei Chu; Chun-Yu Lin 001; Shiang-Yu Tsai; Ming-Dou Ker; Ming-Hsiang Song; Chewnpu Jou; Tse-Hua Lu; Jeng-Chou Tseng; Ming-Hsien Tsai 002; Tsun-Lai Hsu; Ping-Fang Hung; Tzu-Heng Chang (ISCAS, 2012)

ESD protection design for wideband RF applications in 65-nm CMOS process. - Li-Wei Chu; Chun-Yu Lin 001; Ming-Dou Ker; Ming-Hsiang Song; Jeng-Chou Tseng; Chewnpu Jou; Ming-Hsien Tsai 002 (ISCAS, 2014)

A 60 V Tolerance Transceiver With ESD Protection for FlexRay-Based Communication Systems. - Chua-Chin Wang; Chih-Lin Chen; Zong-You Hou; Yi Hu; Jam-Wem Lee; Wan-Yen Lin; Yi-Feng Chang; Chia-Wei Hsu; Ming-Hsiang Song (IEEE Trans. Circuits Syst. I Regul. Pap., 2015)

Layout Guidelines against Charging Damage from the Well-Side Antennas in Separated Power Domains. - Hsi-Yu Kuo; Yu-Lin Chu; Hung-Da Dai; Chun-Chi Wang; Pei-Jung Lin; Shu-Cheng Kuo; Ethan Guo; Ya-Min Zhang; Yu-Ti Su; Chia-Lin Hsu; Kuan-Hung Chen; Tsung-Yuan Chen; et al. (IRPS, 2024)

Machine Learning Powered Single Event Latch-up (SEL) Failure Rate Prediction Methodology in Advanced Bulk FinFET Technology. - Tzu-Hao Chiang; Chien-Yao Huang; Jam-Wem Lee; Kuo-Ji Chen; Ming-Hsiang Song (IRPS, 2025)

Well-Charging Damage to Capacitors Connected Between VDD and VSS in a Single Power Domain. - Hsi-Yu Kuo; Yu-Lin Chu; Chien-Jen Wang; Steven Sze Hang Poon; Chun-Wei Yao; Hsuan Chu; Yi-Ching Chen; Yi-Lun Chen; Yu-Ti Su; Chia-Lin Hsu; Tsung-Yuan Chen; Te-Liang Li; et al. (IRPS, 2025)