The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit. - Ming-Hung Han; Yiming Li 005; Chih-Hong Hwang (Microelectron. Reliab., 2010)

Statistical variability in FinFET devices with intrinsic parameter fluctuations. - Chih-Hong Hwang; Yiming Li 005; Ming-Hung Han (Microelectron. Reliab., 2010)

Quantum hydrodynamic simulation of discrete-dopant fluctuated physical quantities in nanoscale FinFET. - Yiming Li; Hui-Wen Cheng; Ming-Hung Han (Comput. Phys. Commun., 2011)