A solution to the unequal area facilities layout problem by genetic algorithm. - Ming-Jaan Wang; Michael H. Hu; Meei-Yuh Ku (Comput. Ind., 2005)

Using EWMA control schemes for monitoring wafer quality in negative binomial process. - Fong-Jung Yu; Yung-Yu Yang; Ming-Jaan Wang; Zhang Wu (Microelectron. Reliab., 2011)