Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. - Dong Xiang; Ming-Jing Chen; Jia-Guang Sun; Hideo Fujiwara (Asian Test Symposium, 2003)

Scan-Based BIST Using an Improved Scan Forest Architecture. - Dong Xiang; Ming-Jing Chen; Kaiwei Li; Yu-Liang Wu (Asian Test Symposium, 2004)

Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST. - Dong Xiang; Ming-Jing Chen; Hideo Fujiwara (Asian Test Symposium, 2005)

Improving test effectiveness of scan-based BIST by scan chain partitioning. - Dong Xiang; Ming-Jing Chen; Jia-Guang Sun; Hideo Fujiwara (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005)

5 GHz phase locked loop with auto band selection. - Ko-Chi Kuo; Ming-Jing Chen (APCCAS, 2008)