An Embedded Built-in-Self-Test Approach for Digital-to-Analog Converters. - Jeng-Horng Tsai; Ming-Jun Hsiao; Tsin-Yuan Chang (Asian Test Symposium, 2001)

A low-cost CMOS time interval measurement core. - Ming-Jun Hsiao; Jing-Reng Huang; Shao-Shen Yang; Tsin-Yuan Chang (ISCAS (4), 2001)

A built-in timing parametric measurement unit. - Ming-Jun Hsiao; Jing-Reng Huang; Shao-Shen Yang; Tsin-Yuan Chang (ITC, 2001)

An Embedded Built-In-Self-Test Approach for Analog-to-Digital Converters. - Sheng-Hung Hsieh; Ming-Jun Hsiao; Tsin-Yuan Chang (Asian Test Symposium, 2002)

An Access Timing Measurement Unit of Embedded Memory. - Shu-Rong Lee; Ming-Jun Hsiao; Tsin-Yuan Chang (Asian Test Symposium, 2002)

A Measurement Unit for Input Signal Analysis of SRAM Sense Amplifier. - Yi-Ming Sheng; Ming-Jun Hsiao; Tsin-Yuan Chang (Asian Test Symposium, 2004)

A Built-In Parametric Timing Measurement Unit. - Ming-Jun Hsiao; Jing-Reng Huang; Tsin-Yuan Chang (IEEE Des. Test Comput., 2004)