ATPG and Test Compression for Probabilistic Circuits. - Kai-Chieh Yang; Ming-Ting Lee; Chen-Hung Wu; James Chien-Mo Li (VLSI-DAT, 2019)

High Efficiency and Low Overkill Testing for Probabilistic Circuits. - Ming-Ting Lee; Chen-Hung Wu; Shi-Tang Liu; Cheng-Yun Hsieh; James Chien-Mo Li (ITC-Asia, 2020)