Deep learning library testing via effective model generation. - Zan Wang; Ming Yan 010; Junjie Chen 003; Shuang Liu 007; Dongdi Zhang (ESEC/SIGSOFT FSE, 2020)

Deep Neural Network Test Coverage: How Far Are We? - Junjie Chen 003; Ming Yan 010; Zan Wang; Yuning Kang; Zhuo Wu (CoRR, 2020)

Practical Accuracy Estimation for Efficient Deep Neural Network Testing. - Junjie Chen 003; Zhuo Wu; Zan Wang; Hanmo You; Lingming Zhang 001; Ming Yan 010 (ACM Trans. Softw. Eng. Methodol., 2020)

Exposing numerical bugs in deep learning via gradient back-propagation. - Ming Yan 010; Junjie Chen 003; Xiangyu Zhang 001; Lin Tan 001; Gan Wang; Zan Wang (ESEC/SIGSOFT FSE, 2021)

An Empirical Study on Numerical Bugs in Deep Learning Programs. - Gan Wang; Zan Wang; Junjie Chen 003; Xiang Chen 005; Ming Yan 010 (ASE, 2022)

Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations. - Ming Yan 010; Junjie Chen 003; Hangyu Mao; Jiajun Jiang; Jianye Hao; Xingjian Li 007; Zhao Tian; Zhichao Chen; Dong Li 016; Zhangkong Xian; Yanwei Guo; Wulong Liu; et al. (ICSE-SEIP, 2023)

COCO: Testing Code Generation Systems via Concretized Instructions. - Ming Yan 010; Junjie Chen 003; Jie M. Zhang; Xuejie Cao; Chen Yang; Mark Harman (CoRR, 2023)

Stratified random sampling for neural network test input selection. - Zhuo Wu; Zan Wang; Junjie Chen 003; Hanmo You; Ming Yan 010; Lanjun Wang (Inf. Softw. Technol., 2024)

Revisiting deep neural network test coverage from the test effectiveness perspective. - Ming Yan 010; Junjie Chen 003; Xuejie Cao; Zhuo Wu; Yuning Kang; Zan Wang (J. Softw. Evol. Process., 2024)

Robustness evaluation of code generation systems via concretizing instructions. - Ming Yan 010; Junjie Chen 003; Jie M. Zhang; Xuejie Cao; Chen Yang; Mark Harman (Inf. Softw. Technol., 2025)

Evaluating Spectrum-Based Fault Localization on Deep Learning Libraries. - Ming Yan 010; Junjie Chen 003; Tianjie Jiang; Jiajun Jiang; Zan Wang (IEEE Trans. Software Eng., 2025)