Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. - Minh Quach; Kim Harper (ITC, 1997)

Current ratios: a self-scaling technique for production I_DDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 1999)

Characterization and optimization of the production probing process. - Minh Quach; Rich Samuelson; David Shaw (ITC, 1999)

Current ratios: a self-scaling technique for production IDDQ testing. - Peter C. Maxwell; Pete O'Neill; Robert C. Aitken; Ronald Dudley; Neal Jaarsma; Minh Quach; Don Wiseman (ITC, 2000)

Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. - Minh Quach; Tuan Pham; Tim Figal; Bob Kopitzke; Pete O'Neill (ITC, 2002)

Elucidating the structure of genetic regulatory networks: a study of a second order dynamical model on artificial data. - Minh Quach; Pierre Geurts (ESANN, 2006)

Critical roles of RF and microwave electromagnetic field solver simulators in multi-gigabit high-speed digital applications. - Minh Quach; Mark Hinton; Regee Petaja (ITC, 2007)

Estimating parameters and hidden variables in non-linear state-space models based on ODEs for biological networks inference. - Minh Quach; Nicolas Brunel; Florence d'Alché-Buc (Bioinform., 2007)