Reliability Assessment of Optoelectronic Systems with Stochastic Interactions under Accelerated Degradation Testing. - Minh-Tuan Truong; Phuc Do; Laurent Mendizabal; Benoît Iung (ICSRS, 2019)

Digital Signatures Using Hardware Security Modules for Electronic Bills in Vietnam: Open Problems and Research Directions. - Minh-Tuan Truong; Quang-Vinh Dang 001 (FDSE (CCIS Volume), 2020)

A Bayesian-based optimization approach for accelerated degradation test plan of a LED component with self-heating impact. - Minh-Tuan Truong; Phuc Do; Laurent Mendizabal; Benoît Iung (ICSC, 2022)

Modelling and application of joint maintenance grouping and workload smoothing for an automotive plant. - Minh-Tuan Truong; Hai Canh Vu; Phuc Do; Benoît Iung; Alexandre Voisin (Int. J. Prod. Res., 2024)