Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory. - Jonghyeon Ha; Minji Bang; Gyeongyeop Lee; Minki Suh; Chong-Eun Kim; Jungsik Kim (IEEE Access, 2023)

Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models. - Jonghyeon Ha; Sun-Jin Kim; Minji Bang; Gyeongyeop Lee; Minki Suh; Minseob Shim; Chong-Eun Kim; Jungsik Kim (IEEE Access, 2023)

Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell. - Minji Bang; Jonghyeon Ha; Minki Suh; Dabok Lee; Minsang Ryu; Jin-Woo Han; Hyunchul Sagong; Hojoon Lee; Jungsik Kim (IEEE Access, 2024)

Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAM. - Minki Suh; Minsang Ryu; Jonghyeon Ha; Minji Bang; Dabok Lee; Hojoon Lee; Hyunchul Sagong; Jungsik Kim (IEEE Access, 2024)

Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature. - Minsang Ryu; Minki Suh; Jonghyeon Ha; Minji Bang; Dabok Lee; Hojoon Lee; Hyunchul Sagong; Dong-Seok Kim; Jungsik Kim (IEEE Access, 2025)