Deep Learning-Based Multi-Species Appearance Defect Detection Model for MLCC. - Minjie Du; Meiyun Chen; Xiuhua Cao; Kiyoshi Takamasu (IEEE Trans. Instrum. Meas., 2024)

A generalized defect-data-free defect inspection method based on image reconstruction and anomaly detection. - Minjie Du; Siqi Gu; Zihan Qin; Lizhe Xie; Zheng Wang; Yining Hu (Neural Networks, 2025)