SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering. - MinJin Hwang; Bappaditya Dey; Enrique Dehaerne; Sandip Halder; Young-han Shin (CoRR, 2023)

Continuous Wavelet Transform and Siamese Network-Based Anomaly Detection in Multi-variate Semiconductor Process Time Series. - Bappaditya Dey; Daniel Sorensen; MinJin Hwang; Sandip Halder (CoRR, 2025)