Development of High Density 3D NAND Flash Memory Using New Scaling Technologies for AI Semiconductor. - Daewoong Kang; Minkyo Suh; Gwansun Choi; Chaeyeon Jung (ICCE, 2025)

Improvement of Erase Performance Using p-Type Gate in IGZO Channel-Based 3D NAND Flash. - Minkyo Suh; Youngho Jung; Daewoong Kang (IEEE Access, 2025)