Total ionizing dose radiation effect on the threshold voltage for the uniaxial strained Si nano NMOSFET. - Minru Hao; Huiyong Hu; Chen-Guang Liao; Haiyan Kang; Han Su; Qian Zhang; Yingbo Zhao (IEICE Electron. Express, 2017)

Effects of gamma-ray radiation on channel current of the uniaxial strained Si nano-scale NMOSFET. - Minru Hao; Huiyong Hu; Chen-Guang Liao; Bin Wang (IEICE Electron. Express, 2017)

Two dimensional electrical conductivity model of the solid state plasma for SPiN device. - Haiyan Kang; Huiyong Hu; Bin Wang; Han Su; Minru Hao; Yingbo Zhao (IEICE Electron. Express, 2017)

Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET. - Minru Hao; Huiyong Hu; Chen-Guang Liao; Bin Wang; Haiyan Kang; He-Ming Zhang (Microelectron. Reliab., 2017)