Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy. - Luisa Watkins; Sheila W. Seidel; Minxu Peng; Akshay Agarwal 003; Christopher C. Yu; Vivek K. Goyal (ICIP, 2021)

Convolutional Neural Network Denoising of Focused Ion Beam Micrographs. - Minxu Peng; Mertcan Cokbas; Unay Dorken Gallastegi; Prakash Ishwar; Janusz Konrad; Brian Kulis; Vivek K. Goyal (MLSP, 2021)

Time-Resolved Focused Ion Beam Microscopy: Modeling, Estimation Methods, and Analyses. - Minxu Peng; John Murray-Bruce; Vivek K. Goyal (IEEE Trans. Computational Imaging, 2021)

Online Beam Current Estimation in Particle Beam Microscopy. - Sheila W. Seidel; Luisa Watkins; Minxu Peng; Akshay Agarwal 003; Christopher C. Yu; Vivek K. Goyal (IEEE Trans. Computational Imaging, 2022)

Continuous-Time Modeling and Analysis of Particle Beam Metrology. - Akshay Agarwal 003; Minxu Peng; Vivek K. Goyal (IEEE J. Sel. Areas Inf. Theory, 2023)

Denoising Particle Beam Micrographs With Plug-and-Play Methods. - Minxu Peng; Ruangrawee Kitichotkul; Sheila W. Seidel; Christopher C. Yu; Vivek K. Goyal (IEEE Trans. Computational Imaging, 2023)