Smart Temperature Sensor for On-Line Monitoring in Automotive Applications. - José Luis Merino; Sebastià A. Bota; A. Herms; Josep Samitier; Enric Cabruja; Xavier Jordà; Miquel Vellvehí; J. Bausells; A. Ferré; J. Bigorra (IOLTW, 2001)

Reduction of self-heating effect on SOIM devices. - Jaume Roig; David Flores; Miquel Vellvehí; José Rebollo; José Millán (Microelectron. Reliab., 2002)

IGBT gate driver IC with full-bridge output stage using a modified standard CMOS process. - Amador Pérez-Tomás; Xavier Jordà; Philippe Godignon; Jose Luis Gálvez; Miquel Vellvehí; José Millán (Microelectron. J., 2004)

Self-heating experimental study of 600V PT-IGBTs under low dissipation energies. - Xavier Perpiñà; Xavier Jordà; N. Mestres; Miquel Vellvehí; Philippe Godignon; José Millán (Microelectron. J., 2004)

Design considerations for 6.5 kV IGBT devices. - Miquel Vellvehí; David Flores; Xavier Jordà; Salvador Hidalgo; José Rebollo; L. Coulbeck; P. Waind (Microelectron. J., 2004)

Coupled electro-thermal simulation of a DC/DC converter. - Miquel Vellvehí; Xavier Jordà; Philippe Godignon; Carles Ferrer 001; José Millán (Microelectron. Reliab., 2007)

SiC Schottky Diodes for Harsh Environment Space Applications. - Philippe Godignon; Xavier Jordà; Miquel Vellvehí; Xavier Perpiñà; Viorel Banu; Demetrio López; Juan Barbero; Pierre Brosselard; Silvia Massetti (IEEE Trans. Ind. Electron., 2011)

Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. - Xavier Perpiñà; Xavier Jordà; Miquel Vellvehí; José Rebollo; Michel Mermet-Guyennet (IEEE Trans. Ind. Electron., 2011)

DC temperature measurements for power gain monitoring in RF power amplifiers. - Josep Altet; Diego Mateo; Didac Gómez; Xavier Perpiñà; Miquel Vellvehí; Xavier Jordà (ITC, 2012)

Thermal cycling analysis of high temperature die-attach materials. - Luis A. Navarro; Xavier Perpiñà; Miquel Vellvehí; Viorel Banu; Xavier Jordà (Microelectron. Reliab., 2012)

Design for reliability of solid state lighting systems. - Xavier Perpiñà; Robert J. Werkhoven; Jiri Jakovenko; J. Formánek; Miquel Vellvehí; Xavier Jordà; Jos M. G. Kunen; Peter Bancken; Pieter Jan Bolt (Microelectron. Reliab., 2012)

High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs. - Viorel Banu; Philippe Godignon; Mihaela Alexandru; Miquel Vellvehí; Xavier Jordà; José Millán (ESSCIRC, 2013)

4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits. - Mihaela Alexandru; Viorel Banu; Philippe Godignon; Miquel Vellvehí; José Millán (ESSDERC, 2013)

Design methodologies for reliability of SSL LED boards. - Jiri Jakovenko; J. Formánek; X. Perpiñà; Xavier Jordà; Miquel Vellvehí; Robert J. Werkhoven; Miroslav Husák; J. M. G. Kunen; P. Bancken; P. J. Bolt; A. Gasse (Microelectron. Reliab., 2013)

Thermal resistance investigations on new leadframe-based LED packages and boards. - B. Pardo; A. Gasse; A. Fargeix; Jiri Jakovenko; Robert J. Werkhoven; Xavier Perpiñà; Xavier Jordà; Miquel Vellvehí; T. Van Weelden; P. Bancken (Microelectron. Reliab., 2013)

Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing. - Javier Leon; Xavier Perpiñà; Miquel Vellvehí; Xavier Jordà; Philippe Godignon (ESSDERC, 2014)

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. - Josep Altet; Eduardo Aldrete-Vidrio; Ferran Reverter; Didac Gómez; José Luis González 001; Marvin Onabajo; José Silva-Martínez; B. Martineau; X. Perpiñà; Louay Abdallah; Haralampos-G. D. Stratigopoulos; Xavier Aragonès; et al. (MWSCAS, 2014)

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. - Josep Altet; José Luis González 001; Didac Gómez; Xavier Perpiñà; Wilfrid Claeys; Stéphane Grauby; Cédric Dufis; Miquel Vellvehí; Diego Mateo; Ferran Reverter; Stefan Dilhaire; Xavier Jordà (Microelectron. J., 2014)

Temperature effects on the ruggedness of SiC Schottky diodes under surge current. - Javier Leon; Xavier Perpiñà; Viorel Banu; Josep Montserrat; Maxime Berthou; Miquel Vellvehí; Philippe Godignon; Xavier Jordà (Microelectron. Reliab., 2014)

Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications. - Xavier Perpiñà; Xavier Jordà; Javier Leon; Miquel Vellvehí; Daniel Antón; Sergio Llorente (Microelectron. Reliab., 2014)

Characterization of phase change material systems using a thermal test device. - Xavier Jordà; Jesús Esarte; Xavier Perpiñà; Miquel Vellvehí; Gorka Argandoña; Maite Aresti (Microelectron. J., 2015)

SiC Integrated Circuit Control Electronics for High-Temperature Operation. - Mihaela Alexandru; Viorel Banu; Xavier Jordà; Josep Montserrat; Miquel Vellvehí; Dominique Tournier; José Millán; Philippe Godignon (IEEE Trans. Ind. Electron., 2015)

Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging. - Javier Leon; Xavier Perpiñà; Jordi Sacristán; Miquel Vellvehí; Antoni Baldi; Xavier Jordà (IEEE Trans. Ind. Electron., 2015)

Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. - Manuel Fernandez; Xavier Perpiñà; Jaume Roig-Guitart; Miquel Vellvehí; Filip Bauwens; Marnix Tack; Xavier Jordà (IEEE Trans. Ind. Electron., 2017)

Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices. - Manuel Fernandez; Xavier Perpiñà; José Rebollo; Miquel Vellvehí; David Sanchez; Tomás Cabeza; Sergio Llorente; Xavier Jordà (IEEE Trans. Ind. Electron., 2019)

Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. - Xavier Perpiñà; Ferran Reverter; Javier Leon; Enrique Barajas; Miquel Vellvehí; Xavier Jordà; Josep Altet (IEEE Trans. Instrum. Meas., 2019)

Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. - Miquel Vellvehí; Xavier Perpiñà; Javier Leon; Oriol Avino-Salvado; Conrad Ferrer; Xavier Jordà (IEEE Trans. Ind. Electron., 2021)

Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. - Conrad Ferrer; Oriol Avino-Salvado; Miquel Vellvehí; Xavier Jordà; Xavier Perpiñà (IEEE Trans. Instrum. Meas., 2023)