Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures. - Miroslav Kotzev; Renato Rimolo-Donadio; Young Hoon Kwark; Christian W. Baks; Xiaoxiong Gu; Christian Schuster (IEEE Trans. Instrum. Meas., 2012)

Probing and fixturing techniques for wideband multiport measurements in digital packaging. - Miroslav Kotzev (2013)