Delay Fault Coverage Increasing in Digital Circuits. - Miroslav Siebert; Elena Gramatová (DSD, 2013)

Parameterized Critical Path Selection for Delay Fault Testing. - Miroslav Siebert; Elena Gramatová (DDECS, 2015)

A new method for path criticality calculation. - Róbert Tamási; Miroslav Siebert; Elena Gramatová; Petr Fiser (DDECS, 2016)