Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies. - Peng Xiao; Haris Hadziosmanovic; Rong Jiang; Misagh Rostami-asrabad; Stephen Ramey; Ilan Tsamaret (IRPS, 2020)

The Voltage Dependence of NBTI: Resolution of Controversy Surrounding Power Law vs. Exponential. - Narendra Parihar; Elias Frantz; Misagh Rostami-asrabad; Stephen M. Ramey (IRPS, 2025)