Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. - A. Frisch; Mitch Aigner; T. Almy; Hans J. Greub; Mousumi Mitra Hazra; S. Mohr; Nicholas J. Naclerio; W. Russell; M. Stebniskey (ITC, 1995)

Embedded At-Speed Test Probe. - Mitch Aigner (ITC, 1997)