Optical semiconductor device reliability. - Mitsuo Fukuda (Microelectron. Reliab., 2002)

Optical source reliability in recent optical fiber transmission systems and consumer electronics. - Mitsuo Fukuda (Microelectron. Reliab., 2006)

Reliability of semiconductor lasers used in current communication systems and sensing equipment. - Mitsuo Fukuda (Microelectron. Reliab., 2007)

Surface Plasmon Devices for Nanoscale Integration with Electronic Device on Silicon - Optical Signal Transmission and Detection through Surface Plasmon on Nanoscale Circuit. - Mitsuo Fukuda; Takuma Aihara; Masashi Fukuhara; A. Takeda; Yuya Ishii; Takeshi Ishiyama (PHOTOPTICS, 2014)

Plasmonic and electronic device integrated circuits and their characteristics. - Mitsuo Fukuda; Hiroki Sakai; T. Mano; Yu Kimura; Masashi Ota; Masashi Fukuhara; Takuma Aihara; Yuya Ishii; Takeshi Ishiyama (ESSDERC, 2015)

Feasibility of Plasmonic Circuits in Nanophotonics. - Mitsuo Fukuda; Shinya Okahisa; Yuta Tonooka; Masashi Ota; Takuma Aihara; Yasuhiko Ishikawa (IEEE Access, 2020)