A Method of Precise Estimation of Physical Parameters in LSI Interconnect Structures. - Toshiki Kanamoto; Tetsuya Watanabe; Mitsutoshi Shirota; Masayuki Terai; Tatsuya Kunikiyo; Kiyoshi Ishikawa; Yoshihide Ajioka; Yasutaka Horiba (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2005)

A Fast Characterizing Method for Large Embedded Memory Modules on SoC. - Masahiko Omura; Toshiki Kanamoto; Michiko Tsukamoto; Mitsutoshi Shirota; Takashi Nakajima; Masayuki Terai (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2007)